Today's chip designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries, and gate counts are pushing towards the 100M gate mark. Semiconductor companies creating these ...

MOUNTAIN VIEW, Calif. -- Oct. 5, 2015 -- Synopsys, Inc. (Nasdaq: SNPS) today announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test ...

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...