集成电路测试的目的是希望在一批器件中找出有缺陷的器件，从而将交付的DPPM(每百万器件中的缺陷器件数目)降低至100以下。通过对自动测试图样生成(ATPG)算法进行一些设计修改，就可能在合理的测试图样数目下达到较高的缺陷覆盖率。本文描述了在评估不同 ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

芯片设计解决方案供应公司微捷码(Magma)设计自动化公司，发表有片上扫描链压缩功能的Talus ATPG与Talus ATPGX。这些先进的自动测试向量生成(ATPG)产品使设计师能明显改进测试质量，减少周转时间并且降低纳米级芯片的成本。 芯片设计解决方案供应公司微捷码 ...

MOUNTAIN VIEW, Calif. -- Oct. 5, 2015 -- Synopsys, Inc. (Nasdaq: SNPS) today announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

WILSONVILLE, Ore., May 18, 2015 -- Mentor Graphics Corp. (NASDAQ: MENT) today announced that Mellanox Technologies has standardized on the new Mentor® Tessent® Hierarchical ATPG solution to manage the ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

The semiconductor industry has long relied on scan ATPG (automatic test pattern generation) tools instead of functional test to create stimulus-response patterns with very high fault coverage. But ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...