集成电路测试的目的是希望在一批器件中找出有缺陷的器件，从而将交付的DPPM(每百万器件中的缺陷器件数目)降低至100以下。通过对自动测试图样生成(ATPG)算法进行一些设计修改，就可能在合理的测试图样数目下达到较高的缺陷覆盖率。本文描述了在评估不同 ...

芯片设计解决方案供应公司微捷码(Magma)设计自动化公司，发表有片上扫描链压缩功能的Talus ATPG与Talus ATPGX。这些先进的自动测试向量生成(ATPG)产品使设计师能明显改进测试质量，减少周转时间并且降低纳米级芯片的成本。 芯片设计解决方案供应公司微捷码 ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

WILSONVILLE, Ore., May 18, 2015 -- Mentor Graphics Corp. (NASDAQ: MENT) today announced that Mellanox Technologies has standardized on the new Mentor® Tessent® Hierarchical ATPG solution to manage the ...

Nothing accelerates a testability engineer's receding hairline as the addition of further clock domains to the latest SoC or IC design. Avoiding clock skew during test is becoming one of the biggest ...

Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...

Today's leading-edge system-on-chip (SoC) designs typically have multiple clock domains and, in many cases, multiple internally generated clocks. In test mode, those clocks may be combined into one, ...