Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

TetraMAX II ATPG reduced test generation runtime by an order of magnitude, from an overnight run to less than one hour, while producing 50 percent fewer patterns DecaWave met their silicon test time ...

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...